An international length comparison at an industrial level using a photoelectric incremental encoder as transfer standard

Precision Engineering

Volumn 27, Issue 2, 2003, Pages 151-156

  Israel, W ^a   Tiemann, I ^a   Metz, G ^a   Yamaryo, Y ^b   Maeda, F ^b   Shimomura, T ^b  

^a Dr Johannes Heidenhain GmbH   (Germany)

^b MITUTOYO CORPORATION   (Japan)

Author keywords

Direct traceability; Laser interferometry; Length comparison; Linear encoder; Measurement uncertainty

Indexed keywords

INTERFEROMETRY; MICROSCOPES; PROBABILITY; SOLID STATE LASERS;

LASER INTERFEROMETRY;

PHOTOELECTRICITY;

EID: 0037379073     PISSN: 01416359     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0141-6359(02)00192-7     Document Type: Article

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