Realising traceability to the SI in dimensional metrology - Today and in future

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4401, Issue , 2001, Pages 253-262

  Kunzmann, Horst ^a   Jäger, Frank ^a   Flügge, Jens ^a  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COST EFFECTIVENESS; HIERARCHICAL SYSTEMS; SOCIETIES AND INSTITUTIONS; STANDARDS; TECHNOLOGICAL FORECASTING;

DIMENSIONAL METROLOGY; HIERARCHICAL CALIBRATION CHAINS;

METRIC SYSTEM;

EID: 0035761169     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.445627     Document Type: Article

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