Possibility to increase RF ion source brightness for nuclear microprobe applications

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 201, Issue 4, 2003, Pages 630-636

  Miroshnichenko, V I ^a   Mordik, S N ^a   Olshansky, V V ^b   Stepanov, K N ^b   Storizhko, V E ^a   Sulkio Cleff, B ^c   Voznyy, V ^a  

^a INSTITUTE OF APPLIED PHYSICS   (Ukraine)

^b INSTITUTE OF PLASMA PHYSICS   (Ukraine)

^c UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DAMPING; ELECTRONS; HEATING; HELICONS; ION SOURCES; MAGNETIC FIELD EFFECTS; PLASMA DENSITY;

NUCLEAR MICROPROBE INJECTORS;

NUCLEAR INSTRUMENTATION;

EID: 0037378362     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)02227-9     Document Type: Article

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