Atomically resolved field emission patterns of single-walled carbon nanotubes

Ultramicroscopy

Volumn 94, Issue 3-4, 2003, Pages 175-182

  Liu, Weimin ^a   Hou, Shimin ^a   Zhang, Zhaoxiang ^a   Zhang, Gengmin ^a   Gu, Zhennan ^b   Luo, Ji ^a   Zhao, Xingyu ^a   Xue, Zengquan ^a  

^a PEKING UNIVERSITY   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

Field emission microscope (FEM)

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; ELECTRON EMISSION; FIELD EMISSION MICROSCOPES; TRANSMISSION ELECTRON MICROSCOPY;

COMPRESSION FACTOR;

CARBON NANOTUBES;

CARBON;

ARTICLE; ATOM; CALCULATION; CRYSTAL STRUCTURE; FIELD EMISSION; GEOMETRY; IMAGE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

ALGORITHMS; CARBON; ELECTRONS; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; NANOTUBES, CARBON;

EID: 0037375628     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00262-0     Document Type: Article

References (26)

1. Müller E.W. Z. Phys. 106:1937;541.
2. Good R.H., Müller E.W. Flügge S. Handbuch der Physik. Vol. 21:1956;176-231 Springer, Berlin.
3. Dyke W.P., Dolan W.W. Marton L. Advances in Electronics and Electron Physics. Vol. 8:1956;90-182 Academic Press, New York.
4. Rose D.J. J. Appl. Phys. 27(3):1956;215.
5. Brodie I. Surf. Sci. 70:1978;186.
6. Vu T. Binh, N. Garcia, S.T. Purcell, Advance in Imaging and Electron Physics, Vol. 95, Academic Press, New York, 1996, pp. 63-153.
7. Iijima S., Ichihashi T. Nature. 363:1993;603.
8. Saito Y., Hamaguchi K., Nishino T., Hata K., Tohji K., Kasuya A., Nishina Y. Jpn. J. Appl. Phys. 36(10A):1997;L1340.
9. Dean K.A., Chalamala B.R. Appl. Phys. Lett. 75(19):1999;3017.
10. Dean K.A., Chalamala B.R. J. Appl. Phys. 85(7):1999;3832.
11. Dean K.A., von Allmen P., Chalamala B.R. J. Vac. Sci. Technol. B. 17(5):1999;1959.
12. Zengquan Xue, Weimin Liu, Shimin Hou, Zujin Shi, Zhennan Gu, Hongwen Liu, Xingyu Zhao, Zhaoxiang Zhang, Jinlei Wu, Lianmao Peng, Quande Wu Sci. China. 43A:2000;1182.
13. Lovall D., Buss M., Granguard E., Andres R.P., Reigenberger R. Phys. Rev. B. 61(8):2000;5683.
14. Han S., Ihm J. Phys. Rev. B. 61(15):2000;9986.
15. Jianping Sun, Zhaoxiang Zhang, Shimin Hou, Xingyu Zhao, Zujin Shi, Zhennan Gu, Weimin Liu, Zengquan Xue Acta Phys. Sinica. 50(9):2001;1805.
16. Collazo R., Schlesser R., Sitar Z. Appl. Phys. Lett. 78(14):2001;2058.
17. Dean K.A., Burgin T.P., Chalamata B.R. Appl. Phys. Lett. 79(12):2001;1873.
18. Zhuo G., Duan W.H., Gu B.L. Phys. Rev. Lett. 87(9):2001;095504.
19. Alexandrou I., Kymakis E., Amaratunga G.A.J. Appl. Phys. Lett. 80(8):2002;1435.
20. Han S., Lee M.H., Ihm J. Phys. Rev. B. 65(8):2002;085405.
21. Tada K., Watanabe K. Phys. Rev. Lett. 88(12):2002;127601.
22. Shi Z.J., Lian Y.F., Zhou X.H., Gu Z.N., Zhang Y.G., Iijima S., Zhou L.X., Yue K.T., Zhang S.L. Carbon. 37:1999;1449.
23. Sun Jianping, Zhang Zhaoxiang, Hou Shimin, Zhang Gengmin, Gu Zhennan, Zhao Xingyu, Liu Weimin, Xue Zengquan Appl. Phys. A. 75(4):2002;479.
24. Filip V., Nicolascu D., Okuyama F. J. Vac. Sci. Technol. B. 19(3):2001;1016.
25. E.W. Müller, T.T. Tsong, Field Ion Microscopy, Principles and Applications, Elsevier, New York, 1969, p. 58.
26. Saito Y., Hata K., Murata T. Jpn. J. Appl. Phys. 39:2000;L271.