메뉴 건너뛰기




Volumn 77, Issue 4, 2003, Pages 365-372

Correction of the self-absorption for reversed spectral lines: Application to two resonance lines of neutral aluminium

Author keywords

Optical thickness; Plasma laser spectroscopy; Resonance lines; Reversed spectral lines; Self absorption; Stark effect; Transition probabilities

Indexed keywords

ALUMINUM; ERROR CORRECTION; LASER PULSES; RESONANCE;

EID: 0037375358     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-4073(02)00163-2     Document Type: Article
Times cited : (66)

References (13)
  • 10
    • 0032453794 scopus 로고    scopus 로고
    • On expressions for line optical thickness
    • Kastner SO. On expressions for line optical thickness. JQRST 1998;60(4):515-21.
    • (1998) JQRST , vol.60 , Issue.4 , pp. 515-521
    • Kastner, S.O.1
  • 11
    • 0000238336 scopus 로고
    • A simplex method for function minimization
    • Nelder JA, Mead R. A simplex method for function minimization. Comput J 1965;7:308-13.
    • (1965) Comput J , vol.7 , pp. 308-313
    • Nelder, J.A.1    Mead, R.2
  • 12
    • 0035938178 scopus 로고    scopus 로고
    • Sill transition probabilities measurements in a laser induced plasma
    • Matheron P, Escarguel A, Redon R, Lesage A, Richou J. Sill transition probabilities measurements in a laser induced plasma. JQSRT 2001;69:535-41.
    • (2001) JQSRT , vol.69 , pp. 535-541
    • Matheron, P.1    Escarguel, A.2    Redon, R.3    Lesage, A.4    Richou, J.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.