Correction of self-absorption spectral line and ratios of transition probabilities for homogeneous and LTE plasma

Journal of Quantitative Spectroscopy and Radiative Transfer

Volumn 75, Issue 6, 2002, Pages 747-763

  Amamou, Hssaine ^a   Bois, Andre ^a   Ferhat, Belkacem ^b   Redon, Roland ^a   Rossetto, Bruno ^a   Matheron, Pascal ^a  

^a UNIVERSITÉ DE TOULON   (France)

^b UNIVERSITY OF SCIENCES AND TECHNOLOGY HOUARI BOUMEDIENE   (Algeria)

Author keywords

Doppler effect; Optical thickness; Plasma laser spectroscopy; Self absorption; Silicon multiple lines; Stark effect; Transition probabilities

Indexed keywords

ABSORPTION; ALGORITHMS;

SPECTRAL LINES;

PLASMAS;

PLASMA;

EID: 0037114282     PISSN: 00224073     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-4073(02)00040-7     Document Type: Article

References (12)

1. On expressions for line optical thickness
2. Atomic transition probabilities and lifetimes
3. Sill transition probabilities measurements in a laser induced plasma
4. A simplex method for function minimisation
5. A single laser spark in aqueous medium