Spatial coherence radar applied for tilted surface profilometry

Optical Engineering

Volumn 42, Issue 3, 2003, Pages 830-836

  Gokhler, Mark ^a   Duan, Zhihui ^b   Rosen, Joseph ^a   Takeda, Mitsuo ^b  

^a BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^b UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

Coherence; Interferometry; Surfaces; Tomography

Indexed keywords

COHERENT LIGHT; INTERFEROMETERS; PROFILOMETRY; SPATIAL VARIABLES MEASUREMENT;

FRESNEL ZONES;

RADAR IMAGING;

EID: 0037356389     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.1542893     Document Type: Article

References (7)

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