Focused ion beam milling: A practical method for preparing cast Al-Si alloy samples for transmission electron microscopy

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 34 A, Issue 3, 2003, Pages 705-707

  Shankar, S ^a   Riddle, Y W ^a   Makhlouf, M M ^a  

^a Worcester Polytechnic Institute   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; ELECTROLYTIC POLISHING; ELECTRON DIFFRACTION; EUTECTICS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SURFACES; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN;

CAST ALUMINUM SILICON ALLOYS; ELECTROSTATIC PROBE; FOCUSED ION BEAM MILLING; ION IMPINGEMENT;

ION BEAMS;

EID: 0037355519     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-003-0105-1     Document Type: Article

References (6)

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3. L.A. Giannuzzi and F.A. Stevie: Micron, 1999, vol. 30, pp. 197-204.
4. J.E. Gruzleski and B. Closset: Treatment of Liquid Aluminum Silicon Alloys, American Foundrymen Society, Des Plaines, IL, June 1990.
5. S. Lu and A. Hellawell: J. Cryst. Growth, 1985, vol. 73, pp. 316-21.
6. S. Lu and A. Hellawell: Metall. Trans. A, 1987, vol. 18A, pp. 1721-33.