Update in a Rietveld analysis program for x-ray powder spectro-diffractometry

Powder Diffraction

Volumn 18, Issue 1, 2003, Pages 32-35

  Xiao, Yanan ^a,b   Izumi, Fujio ^c   Graber, Timothy ^b   James Viccaro, P ^b   Wittmer, Dale E ^a  

^a Southern Illinois University at Carbondale   (United States)

^b UNIVERSITY OF CHICAGO   (United States)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Anomalous scattering; RIETAN; Rietveld analysis; Spectro diffractometry; Synchrotron x ray powder diffraction

Indexed keywords

RIETVELD ANALYSIS;

COMPUTER PROGRAM LISTINGS; COMPUTER SIMULATION; LATTICE CONSTANTS; MANGANESE COMPOUNDS; SCATTERING; X RAY POWDER DIFFRACTION;

CRYSTAL STRUCTURE;

EID: 0037355478     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.1495501     Document Type: Article

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