-
1
-
-
0000314517
-
Measurement of translational and angular vibration using a scanning laser Doppler vibrometer
-
A. B. Stanbridge, D. J. Ewins, "Measurement of translational and angular vibration using a scanning laser Doppler vibrometer." Shock Vibrat. 3(2), 141-152 (1996).
-
(1996)
Shock Vibrat.
, vol.3
, Issue.2
, pp. 141-152
-
-
Stanbridge, A.B.1
Ewins, D.J.2
-
2
-
-
84958489005
-
Non-contacting vibration measurement: Role in design and industrial applications
-
Stress and Vibration: Recent Developments in Industrial Measurement and Analysis, P. Staneley, Ed.
-
A. J. Baker, P. E. Jaeger, and D. E. Oliver, "Non-contacting vibration measurement: role in design and industrial applications," in Stress and Vibration: Recent Developments in Industrial Measurement and Analysis, P. Staneley, Ed., Proc. SPIE 1084, 293-299 (1989).
-
(1989)
Proc. SPIE
, vol.1084
, pp. 293-299
-
-
Baker, A.J.1
Jaeger, P.E.2
Oliver, D.E.3
-
3
-
-
0012806451
-
-
Technical Notes, Polytech GMBH
-
H. Selbach, Technical Notes, Polytech GMBH.
-
-
-
Selbach, H.1
-
4
-
-
0030395484
-
Global noise characteristics of a laser Doppler vibrometer part I: Theory
-
R. F. Strean, L. D. Mitchell, and A. J. Barker, "Global noise characteristics of a laser Doppler vibrometer part I: theory," Proc. SPIE 2868, 2-11 (1996).
-
(1996)
Proc. SPIE
, vol.2868
, pp. 2-11
-
-
Strean, R.F.1
Mitchell, L.D.2
Barker, A.J.3
-
5
-
-
0030385173
-
Global noise characteristics of a laser Doppler vibrometer part II: Experiments using beam dynamics
-
R. F. Strean, L. D. Mitchell, and A. J. Barker, "Global noise characteristics of a laser Doppler vibrometer part II: experiments using beam dynamics," Proc. SPIE 2868, 97-105 (1996).
-
(1996)
Proc. SPIE
, vol.2868
, pp. 97-105
-
-
Strean, R.F.1
Mitchell, L.D.2
Barker, A.J.3
-
6
-
-
0034315989
-
Scanning laser Doppler vibrometer for dynamic study of small features
-
B. K. A. Ngoi, and K. Venkatakrishnan, "Scanning laser Doppler vibrometer for dynamic study of small features," Opt. Eng. 39(11), 2995-3000 (2000).
-
(2000)
Opt. Eng.
, vol.39
, Issue.11
, pp. 2995-3000
-
-
Ngoi, B.K.A.1
Venkatakrishnan, K.2
-
7
-
-
0031271325
-
Defect detection algorithm for wafer inspection based on laser scanning
-
N. Mehrdad, C. E. Wayman, and S. A. Biellak, "Defect detection algorithm for wafer inspection based on laser scanning," IEEE Trans. Semicond. Manuf. 10(4), (1997).
-
(1997)
IEEE Trans. Semicond. Manuf.
, vol.10
, Issue.4
-
-
Mehrdad, N.1
Wayman, C.E.2
Biellak, S.A.3
-
8
-
-
0034862144
-
Reference-free mode shape identification with a continuously scanning laser Doppler vibrometer (SLDV)
-
Y. K. Ho and D. J. Ewins, "Reference-free mode shape identification with a continuously scanning laser Doppler vibrometer (SLDV)," Proc. SPIE 4317, 604-609 (2001).
-
(2001)
Proc. SPIE
, vol.4317
, pp. 604-609
-
-
Ho, Y.K.1
Ewins, D.J.2
-
9
-
-
0004175949
-
-
Prentice Hall, Englewood Cliffs, NJ
-
D. J. Inman, Engineering Vibration, pp. 386-392, Prentice Hall, Englewood Cliffs, NJ (1996).
-
(1996)
Engineering Vibration
, pp. 386-392
-
-
Inman, D.J.1
-
11
-
-
0003498504
-
-
Academic Press
-
I. S. Gradshteyn and I. M. Ryzhik, Table of Integrals, Series, and Products, p. 25, Academic Press (1980).
-
(1980)
Table of Integrals, Series, and Products
, pp. 25
-
-
Gradshteyn, I.S.1
Ryzhik, I.M.2
-
12
-
-
0003498504
-
-
Academic Press
-
I. S. Gradshteyn and I. M. Ryzhik, Table of Integrals, Series, and Products, p. 1032, Academic Press (1980).
-
(1980)
Table of Integrals, Series, and Products
, pp. 1032
-
-
Gradshteyn, I.S.1
Ryzhik, I.M.2
|