Ultrashort pulse reflectometry for electron density profile measurements on SSPX

Review of Scientific Instruments

Volumn 72, Issue 1 II, 2001, Pages 332-335

  Roh, Y ^a   Domier, C W ^a   Luhmann Jr , N C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000611674     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1308999     Document Type: Article

References (3)

1. C. Laviron, A. J. H. Donné, M. E. Manso, and J. Sanchez, Plasma Phys. Controlled Fusion 38, 905 (1996).
2. C. W. Domier et al., Rev. Sci. Instrum. 63, 4666 (1992).
3. C. W. Domier, Y. Roh, and N. C. Luhmann, Jr., Rev. Sci. Instrum. 70, 1038 (1999).