Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser

Review of Scientific Instruments

Volumn 70, Issue 1 II, 1999, Pages 629-632

  Kalantar, D H ^a   Chandler, E A ^a   Colvin, J D ^a   Lee, R ^a   Remington, B A ^a   Weber, S V ^a   Wiley, L G ^a   Hauer, A ^b   Wark, J S ^c   Loveridge, A ^c   Failor, B H ^d   Meyers, M A ^e   Ravichandran, G ^f  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF OXFORD   (United Kingdom)

^d Physics International   (United States)

^e UNIVERSITY OF CALIFORNIA   (United States)

^f CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000845549     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149384     Document Type: Article

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