4.5- and 8-keV emission and absorption x-ray imaging using spherically bent quartz 203 and 211 crystals (invited)

Review of Scientific Instruments

Volumn 74, Issue 3 II, 2003, Pages 2130-2135

  Koch, J A ^a   Aglitskiy, Y ^b   Brown, C ^c   Cowan, T ^d   Freeman, R ^e   Hatchett, S ^a   Holland, G ^c   Key, M ^a   MacKinnon, A ^a   Seely, J ^c   Snavely, R ^e   Stephens, R ^d  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

^d GENERAL ATOMICS   (United States)

^e UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; DIFFRACTION; QUARTZ; X RAYS;

IMAGING GEOMETRY;

IMAGING SYSTEMS;

EID: 0037348424     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1537448     Document Type: Conference Paper

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