March LA: A test for linked memory faults

Proceedings of European Design and Test Conference

Volumn , Issue , 1997, Pages 627-

  van de Goor, A J ^a   Gaydadjiev, G N ^a   Yarmolik, V N ^a   Mikitjuk, V G ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR DETECTION; LOGIC CIRCUITS; SET THEORY;

COUPLING FAULTS;

DATA STORAGE EQUIPMENT;

EID: 0030676725     PISSN: 10661409     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)