Double Penning trap technique for precise g factor determinations in highly charged ions

European Physical Journal D

Volumn 22, Issue 2, 2003, Pages 163-182

  Haffner H ^a,b,c   Beier, T ^a   Djekic S ^b   Hermanspahn, N ^b,d   Kluge, H J ^a   Quint, W ^a   Stahl, S ^a,b   Verdu J ^b   Valenzuela, T ^b   Werth, G ^b  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^b JOHANNES GUTENBERG UNIVERSITY   (Germany)

^c UNIVERSITY OF INNSBRUCK   (Austria)

^d NONE   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHARGED PARTICLES; QUANTUM THEORY;

ACCURACY TEST; BOUND-STATES; ELECTRO DYNAMICS; ELECTRON BOUND; G FACTORS; HIGH-ACCURACY; HIGHLY CHARGED IONS; PENNING TRAP; SYSTEMATIC UNCERTAINTIES;

MAGNETIC MOMENTS;

EID: 0037321278     PISSN: 14346060     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjd/e2003-00012-2     Document Type: Article

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