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Volumn 12, Issue 2, 2003, Pages 116-123

An EPR study at X- and W-band of defects in a-C:H films in the temperature range 5-300 K

Author keywords

Amorphous carbon; Anisotropy; Defects; EPR

Indexed keywords

CARBON; FERROMAGNETIC RESONANCE; HYDROGENATION; PARAMAGNETIC RESONANCE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;

EID: 0037311313     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(03)00012-8     Document Type: Article
Times cited : (9)

References (26)
  • 15
    • 0001921471 scopus 로고    scopus 로고
    • S.R.P. Silva, J. Robertson, W.I. Milne, G.A. Amaratunga (Eds.), Singapore: World Scientific
    • F. Giorgis, A. Tagliaferro, M. Fanciulli, In S.R.P. Silva, J. Robertson, W.I. Milne, G.A. Amaratunga (Eds.), Amorphous Carbon: State of the Art, World Scientific, Singapore, 1998, p. 143.
    • (1998) Amorphous Carbon: State of the Art , pp. 143
    • Giorgis, F.1    Tagliaferro, A.2    Fanciulli, M.3
  • 16
    • 0013013263 scopus 로고    scopus 로고
    • H. Kuzmany, J. Fink, M. Mehring, S. Roth (Eds.), Singapore: World Scientific
    • D. Arcon, P. Cevc, R. Blinc, in H. Kuzmany, J. Fink, M. Mehring, S. Roth (Eds.), Molecular Nanostructures, World Scientific, Singapore, 1998, p. 533.
    • (1998) Molecular Nanostructures , pp. 533
    • Arcon, D.1    Cevc, P.2    Blinc, R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.