Spectroscopic ellipsometric properties of Ga1-x FexAs dilute magnetic semiconductors

Journal of the Korean Physical Society

Volumn 42, Issue SPEC., 2003, Pages

  Lee, Hosun ^a   Kang, T D ^a   Park, Y J ^b   Oh, H T ^b   Cho, H Y ^c   Moriya, R ^d   Munekata, H ^d  

^a Kyung Hee University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

^c Dongguk University   (South Korea)

^d TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Band structure; Critical point; Dielectric function; Dilute magnetic semiconductor; Ellipsometry

Indexed keywords

EID: 0037307050     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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