How to detect biased samples?

Biometrical Journal

Volumn 45, Issue 1, 2003, Pages 91-112

  Navarro, J ^a   Ruiz, J M ^a   Del Aguila, Y ^b  

^a UNIVERSITY OF MURCIA   (Spain)

^b UNIVERSITY OF ALMERÍA   (Spain)

Author keywords

Characterization; Length biased distributions; Parametric and nonparametric tests; Weighted distributions

Indexed keywords

CHARACTERIZATION; LENGTH BIASED DISTRIBUTION; NONPARAMETRIC TESTS; ORIGINAL MODEL; PARAMETRIC TEST; WEIGHTED DISTRIBUTION;

EID: 0037283682     PISSN: 03233847     EISSN: None     Source Type: Journal    
DOI: 10.1002/bimj.200290018     Document Type: Article

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