Semiparametric likelihood-based inference for biased and truncated data when the total sample size is known

Journal of the Royal Statistical Society. Series B: Statistical Methodology

Volumn 60, Issue 1, 1998, Pages 243-254

  Li, Gang ^a   Qin, Jing ^b,c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

^c Bldg 142   (United States)

Author keywords

Auxiliary information; Sampling bias; Semiparametric likelihood ratio; Truncation

Indexed keywords

EID: 0013378460     PISSN: 13697412     EISSN: None     Source Type: Journal    
DOI: 10.1111/1467-9868.00122     Document Type: Article

References (14)

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