SCOPUS 정보 검색 플랫폼

Volumn 31, Issue 8, 2001, Pages 745-753

Quantitative surface characterization of poly(styrene)/poly(4-vinyl phenol) random and block copolymers by ToF-SIMS and XPS

(6) Liu, Shiyong a,b Weng, Lu Tao a Chan, Chi Ming a Li, Lin a Ho, Nick K a Jiang, Ming b

a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (Hong Kong)

b FUDAN UNIVERSITY (China)

Author keywords

Copolymer; ToF SIMS; XPS

Indexed keywords

BLOCK COPOLYMERS; CALIBRATION; COMPOSITION; MOLECULAR STRUCTURE; SECONDARY ION MASS SPECTROMETRY; SURFACE PHENOMENA; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

POLY STYRENE CO VINYL PHENOL; SURFACE CHARACTERIZATION; SURFACE CHEMICAL COMPOSITION; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY;

AROMATIC POLYMERS;

EID: 0035420825 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1105 Document Type: Article

Times cited : (18)

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