Structural characterization of randomly and vertically oriented carbon nanotube films grown by chemical vapour deposition

Surface and Interface Analysis

Volumn 35, Issue 1, 2003, Pages 15-18

  Ikuno, Takashi ^a   Furuta, Hiroshi ^a,b   Yamamoto, Tetsuro ^a   Takahashi, Syunji ^a   Kamizono, Motoki ^a   Honda, Shin Ichi ^a   Katayama, Mitsuhiro ^a   Hirao, Takashi ^a   Oura, Kenjiro ^a  

^a OSAKA UNIVERSITY   (Japan)

^b NEW ENERGY AND INDUSTRIAL TECHNOLOGY DEVELOPMENT ORGANIZATION   (Japan)

Author keywords

Carbon nanotube; Field electron emission; Structural characterization

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON EMISSION; FIELD EMISSION DISPLAYS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; SURFACE STRUCTURE; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

METAL NANOPARTICLES; STRUCTURAL CHARACTERIZATION; THERMAL CHEMICAL VAPOR DEPOSITION;

CARBON NANOTUBES;

EID: 0037259390     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1485     Document Type: Article

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