Improved techniques for the measurement of phase error in waveguide based optical devices

Journal of Lightwave Technology

Volumn 21, Issue 1, 2003, Pages 198-205

  Chen, Wei ^a   Chen, Yung Jui ^a   Yan, Ming ^b   McGinnis, Brian ^b   Wu, Zhe ^c  

^a Baltimore County   (United States)

^b Lightwave Microsystems   (United States)

^c Z DSP Solutions   (United States)

Author keywords

Arrayed waveguide grating (AWG); Fourier spectroscopy; Optical phase error; Phase measurement; Planar lightwave circuits

Indexed keywords

FOURIER TRANSFORMS; INTEGRATED OPTOELECTRONICS; LIGHT EMITTING DIODES; LIGHT INTERFERENCE; OPTICAL WAVEGUIDES; PHASE MEASUREMENT; SPECTROSCOPY;

ARRAYED-WAVEGUIDE GRATING; FOURIER SPECTROSCOPY; OPTICAL PHASE ERROR; PLANAR LIGHTWAVE CIRCUITS; WAVEGUIDE BASED OPTICAL DEVICES;

DIFFRACTION GRATINGS;

EID: 0037255808     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2002.803060     Document Type: Article

References (5)

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