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Volumn 376, Issue 1-3, 1997, Pages 99-112
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Initial stages of nitridation of Si(111) surfaces: X-ray photoelectron spectroscopy and scanning tunneling microscopy studies
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Author keywords
Growth; Nucleation; Scanning tunneling microscopy; Silicon; Silicon nitride; X ray photoelectron spectroscopy
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Indexed keywords
ANNEALING;
BINDING ENERGY;
CONDENSATION;
NITRIDING;
NUCLEATION;
SCANNING TUNNELING MICROSCOPY;
SILICON NITRIDE;
THERMAL EFFECTS;
X RAY PHOTOELECTRON SPECTROSCOPY;
CHEMICAL SHIFTS;
SILICON;
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EID: 0031120392
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(96)01314-3 Document Type: Article |
Times cited : (36)
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References (37)
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