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Volumn 376, Issue 1-3, 1997, Pages 99-112

Initial stages of nitridation of Si(111) surfaces: X-ray photoelectron spectroscopy and scanning tunneling microscopy studies

Author keywords

Growth; Nucleation; Scanning tunneling microscopy; Silicon; Silicon nitride; X ray photoelectron spectroscopy

Indexed keywords

ANNEALING; BINDING ENERGY; CONDENSATION; NITRIDING; NUCLEATION; SCANNING TUNNELING MICROSCOPY; SILICON NITRIDE; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0031120392     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01314-3     Document Type: Article
Times cited : (36)

References (37)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.