Effect of rapid quenching on Sb grain-boundary segregation in Cu

Materials Letters

Volumn 57, Issue 7, 2003, Pages 1345-1350

  Li, Chunfei ^a   Watanabe, Masashi ^a   Ackland, David W ^a   Williams, David B ^a  

^a LEHIGH UNIVERSITY   (United States)

Author keywords

Analytical electron microscope; Cu Sb alloy; Electron microscopy; Grain boundary; Grain boundary segregation; Rapid quenching

Indexed keywords

COPPER; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; MELT SPINNING; QUENCHING; X RAYS;

RAPID QUENCHING;

ANTIMONY ALLOYS;

EID: 0037242663     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(02)00985-0     Document Type: Article

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