Downsizing of Johansson spectrometer for X-ray fluorescence trace analysis with brilliant undulator source

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 1549-1552

  Sakurai, Kenji ^a   Eba, Hiromi ^a   Inoue, Katsuaki ^b   Yagi, Naoto ^b  

^a National Research Institute for Meterials Science   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

Crystal analyzer; Detection efficiency; Energy resolution; Instrumentation; Ultra trace analysis; Wavelength dispersive X ray fluorescence

Indexed keywords

ENERGY EFFICIENCY; FLUORESCENCE; SPECTROMETERS; WIGGLERS; X RAYS;

CRYSTAL ANALYZERS; DETECTION EFFICIENCY; ENERGY RESOLUTIONS; INSTRUMENTATION; ULTRA-TRACE ANALYSIS; WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCES;

TRACE ANALYSIS;

EID: 0001754574     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00756-2     Document Type: Article

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