Characterization of molybdenum/silicon X-ray multilayers

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 199, Issue , 2003, Pages 128-132

  Nayak, M ^a   Modi, M H ^a   Lodha, G S ^a   Shrivastava, A K ^a   Tripathi, P ^a   Sinha, A K ^a   Sawhney, K J S ^a   Nandedkar, R V ^a  

^a RAJA RAMANNA CENTRE FOR ADVANCED TECHNOLOGY   (India)

Author keywords

Synchrotron radiation; Transmission electron microscopy; X ray multilayer; X ray reflectivity

Indexed keywords

ELECTRON BEAMS; MOLYBDENUM; SYNCHROTRON RADIATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

X-RAY MULTILAYERS;

MULTILAYERS;

EID: 0037240698     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01547-1     Document Type: Article

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