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Journal of Magnetism and Magnetic Materials

Volumn 256, Issue 1-3, 2003, Pages 322-327

Structural and magnetic length scales in amorphous TbFe2

a Johns Hopkins University (United States)

b UNIVERSITY OF CALIFORNIA (United States)

Author keywords

Magnetic correlation length; Microstructure of vapor deposited amorphous films; Perpendicular magnetic anisotropy; Small angle X ray scattering; Striped magnetic domains

Indexed keywords

AMORPHOUS MATERIALS; COERCIVE FORCE; FILM GROWTH; MAGNETIC ANISOTROPY; MAGNETIC DOMAINS; MICROSTRUCTURE; NEUTRON SCATTERING; STRUCTURE (COMPOSITION); THIN FILMS; TOPOLOGY; X RAY SCATTERING;

SMALL-ANGLE X-RAY SCATTERING (SAXS);

TERBIUM COMPOUNDS;

EID: 0037238470 PISSN: 03048853 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-8853(02)00591-7 Document Type: Article

Times cited : (6)

References (14)

1
- 0004128635
- IEEE, New York
- R.J. Gambino, T. Suzuki, (Eds.), Magneto-Optical Recording Materials, IEEE, New York, 1999.
- (1999) Magneto-Optical Recording Materials
- Gambino, R.J.¹ Suzuki, T.²

2
- 0000117969
- Yan X., Hirscher M., Egami T., Marinero E.E. Phys. Rev. B. 43:1991;9300.
- (1991) Phys. Rev. B , vol.43 , pp. 9300
- Yan, X.¹ Hirscher, M.² Egami, T.³ Marinero, E.E.⁴

3
- 11944253476
- Harris V.G., Aylesworth K.D., Das B.N., Elam W.T., Koon N.C. Phys. Rev. Lett. 69:1992;1939.
- (1992) Phys. Rev. Lett. , vol.69 , pp. 1939
- Harris, V.G.¹ Aylesworth, K.D.² Das, B.N.³ Elam, W.T.⁴ Koon, N.C.⁵

4
- 0000743055
- Hellman F., Gyorgy E.M. Phys. Rev. Lett. 68:1992;1391.
- (1992) Phys. Rev. Lett. , vol.68 , pp. 1391
- Hellman, F.¹ Gyorgy, E.M.²

5
- 0001077237
- Hellman F. Appl. Phys. Lett. 64:1994;1947.
- (1994) Appl. Phys. Lett. , vol.64 , pp. 1947
- Hellman, F.¹

6
- 0012697735
- Hufnagel T.C., Brennan S., Zschack P., Clemens B.M. Phys. Rev. B. 53:1996;12024.
- (1996) Phys. Rev. B , vol.53 , pp. 12024
- Hufnagel, T.C.¹ Brennan, S.² Zschack, P.³ Clemens, B.M.⁴

7
- 0000604160
- Hellman F., Shapiro A.L., Abarra E.N., Robinson R.A., Hjelm R.P., Seeger P.A., Rhyne J.J., Suzuki J.I. Phys. Rev. B. 59:1999;11408.
- (1999) Phys. Rev. B , vol.59 , pp. 11408
- Hellman, F.¹ Shapiro, A.L.² Abarra, E.N.³ Robinson, R.A.⁴ Hjelm, R.P.⁵ Seeger, P.A.⁶ Rhyne, J.J.⁷ Suzuki, J.I.⁸

8
- 0032606746
- Hellman F., Messer M., Abarra E.N. J. Appl. Phys. 86:1999;1047.
- (1999) J. Appl. Phys. , vol.86 , pp. 1047
- Hellman, F.¹ Messer, M.² Abarra, E.N.³

9
- 0034496671
- Seifert S., Winans R.E., Tiede D.M., Thiyagarajan P. J. Appl. Cryst. 33:2000;782.
- (2000) J. Appl. Cryst. , vol.33 , pp. 782
- Seifert, S.¹ Winans, R.E.² Tiede, D.M.³ Thiyagarajan, P.⁴

10
- 0003664980
- Technical Report ESRF97HA02T, European Synchrotron Radiation Facility
- A.P. Hammersley, FIT2D: An introduction and overview, Technical Report ESRF97HA02T, European Synchrotron Radiation Facility, 1997.
- (1997) FIT2D: An Introduction and Overview
- Hammersley, A.P.¹

11
- 0029695129
- Hammersley A.P., Svensson S.O., Hanfland M., Fitch A.N., Häusermann D. High Pressure Res. 14:1996;235.
- (1996) High Pressure Res. , vol.14 , pp. 235
- Hammersley, A.P.¹ Svensson, S.O.² Hanfland, M.³ Fitch, A.N.⁴ Häusermann, D.⁵

12
- 0003702492
- New York: Academic Press
- Glatter O., Kratky O. Small Angle X-ray Scattering. 1982;Academic Press, New York.
- (1982) Small Angle X-ray Scattering
- Glatter, O.¹ Kratky, O.²

13
- 0017632484
- Dirks A.G., Leamy H.J. Thin Solid Films. 47:1977;219.
- (1977) Thin Solid Films , vol.47 , pp. 219
- Dirks, A.G.¹ Leamy, H.J.²

14
- 84913821150
- Nakahara S., Hong M., van Dover R.B., Gyorgy E.M., Bacon D.D. J. Vac. Sci. Technol. A. 4:1986;543.
- (1986) J. Vac. Sci. Technol. A , vol.4 , pp. 543
- Nakahara, S.¹ Hong, M.² Van Dover, R.B.³ Gyorgy, E.M.⁴ Bacon, D.D.⁵

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