Development of a new integrating sphere with uniform reflectance for absolute diffuse reflectance measurements

Metrologia

Volumn 40, Issue 1 SPEC., 2003, Pages

  Shitomi, H ^a   Mishima, Y ^a   Saito, I ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MEASUREMENT ERRORS; OPTICAL DESIGN; SPECIFICATIONS; SPECTRUM ANALYZERS;

ABSOLUTE DIFFUSE REFLECTANCE MEASUREMENT; SPECTRALON; UNIFORM REFLECTANCE;

OPTICAL VARIABLES MEASUREMENT;

EID: 0037229451     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/1/003     Document Type: Article

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