Rapid absolute diffuse spectral reflectance factor measurements using a silicon-photodiode array

Color Research and Application

Volumn 22, Issue 4, 1997, Pages 275-279

  Kim, Chang Soon ^a   Kong, Hong Jin ^b  

^a Korea Research Institute of Standards and Science   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Absolute reflectance; Barium sulfate; Colorimetry; Diffuse spectral reflectance factor; PTFE; Silicon pholodiode array; White standard reference

Indexed keywords

BARIUM COMPOUNDS; COATINGS; COLORIMETRY; GEOMETRICAL OPTICS; PHOTODIODES; POLYTETRAFLUOROETHYLENES; SEMICONDUCTING SILICON;

ABSOLUTE REFLECTANCE; BARIUM SULFATE; DIFFUSE SPECTRAL REFLECTANCE FACTOR; SILICON PHOTODIODE ARRAY; WHITE STANDARD REFERENCE;

REFLECTOMETERS;

EID: 0031208647     PISSN: 03612317     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1520-6378(199708)22:4<275::AID-COL8>3.0.CO;2-M     Document Type: Article

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