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Applied Physics A: Materials Science and Processing

Volumn 76, Issue 1, 2003, Pages 33-35

Experimental observation and simulation of fractal patterns of Au/Ge bilayer films

(5) Chen, Z W a Zhang, S Y a Tan, S a Hou, J G a Wu, Z Q a

a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPUTER SIMULATION; CRYSTALLIZATION; FILM GROWTH; FRACTALS; GOLD; NUCLEATION; SEMICONDUCTING GERMANIUM; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

BILAYER FILMS; FRACTAL PATTERNS; SELECTED AREA ELECTRON DIFFRACTION;

MULTILAYERS;

EID: 0037229087 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390201288 Document Type: Article

Times cited : (2)

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