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Volumn 383, Issue 4, 2003, Pages 374-378
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Demonstration of surface resistance mapping of large-area HTS films using the dielectric resonator method
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Author keywords
Dielectric resonator; Mapping; Non destructive measurement; Surface resistance
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Indexed keywords
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
DIELECTRIC MATERIALS;
ELECTRIC RESISTANCE;
HIGH TEMPERATURE EFFECTS;
HIGH TEMPERATURE SUPERCONDUCTORS;
MAPPING;
RESONATORS;
FLUCTUATIONS;
SUPERCONDUCTING FILMS;
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EID: 0037216191
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(02)01347-3 Document Type: Article |
Times cited : (5)
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References (16)
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