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Volumn 383, Issue 4, 2003, Pages 374-378

Demonstration of surface resistance mapping of large-area HTS films using the dielectric resonator method

Author keywords

Dielectric resonator; Mapping; Non destructive measurement; Surface resistance

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DIELECTRIC MATERIALS; ELECTRIC RESISTANCE; HIGH TEMPERATURE EFFECTS; HIGH TEMPERATURE SUPERCONDUCTORS; MAPPING; RESONATORS;

EID: 0037216191     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(02)01347-3     Document Type: Article
Times cited : (5)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.