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Volumn 156, Issue 3-4, 2003, Pages 433-437

The role of defects on the electrochromic response time of sputter-deposited Ni oxide films

Author keywords

Electrochromics; Ni oxide; Response time; Sputtering; Transmittance

Indexed keywords

AMORPHOUS FILMS; CRYSTALLOGRAPHY; DEFECTS; PROTONS; SPUTTER DEPOSITION;

EID: 0037213771     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-2738(02)00696-3     Document Type: Article
Times cited : (10)

References (14)
  • 12
    • 0001452771 scopus 로고    scopus 로고
    • Fourth international conference on thin films physics and applications
    • Wu Y., Wu G., Ni X., Wu X. Fourth International Conference on Thin Films Physics and Applications. Proceedings of SPIE. vol. 4086:2000;418.
    • (2000) Proceedings of SPIE , vol.4086 , pp. 418
    • Wu, Y.1    Wu, G.2    Ni, X.3    Wu, X.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.