Thermal roughening restrained by bulk chemical order: Cu-Pd(17%)( 1 1 5 ) versus Cu( 1 1 5 ) and Cu3Au( 1 1 12 ) surfaces

Surface Science

Volumn 522, Issue 1-3, 2003, Pages 143-160

  Le Goff, E ^a   Barbier, L ^b   Garreau, Y ^a   Sauvage, M ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b CEA SACLAY   (France)

Author keywords

Alloys; Copper; Gold; Palladium; Scanning tunneling microscopy; Step formation and bunching; Stepped single crystal surfaces; Surface roughening; Surface structure, morphology, roughness, and topography; X ray scattering, diffraction, and reflection

Indexed keywords

CRYSTAL STRUCTURE; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; SUPERCONDUCTING TRANSITION TEMPERATURE; SURFACE REACTIONS; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

THERMAL ROUGHENING;

COPPER ALLOYS;

EID: 0037211731     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02341-5     Document Type: Article

References (28)

1. Bermond J.M., Métois J.J., Heyraud J.C., Floret F. Surf. Sci. 416:1998;430.
2. Villain J., Grimpel D., Lapujoulade J. J. Phys. F. 15:1985;809.
3. Williams E.D., Phaneuf R.J., Wei J., Bartelt N.C., Einstein T.E. Surf. Sci. 294:1993;219. Papier Bartelt on surface tension.
4. Le Goff E., Barbier L., Masson L., Salanon B. Surf. Sci. 432:1999;139.
5. Hoogeman M.S., Schlösser D.C., Sanders J.B., Kuipers L., Frenken J.W.M. Phys. Rev. B. 53:1996;R13299.
6. Hoogeman M.S., Klik M.A.J., Schlösser D.C., Kuipers L., Frenken J.W.M. Phys. Rev. Lett. 82:1999;1728.
7. Le Goff E., Le Floc'h D., Barbier L., Goapper S., Loiseau A. B. Salanon. Phys. Rev. B. 63:2001;125418A.
8. Le Goff E., Barbier L., Goapper S., Salanon B. Surf. Sci. 466:2000;73.
9. Le Goff E., Arfaoui I., Barbier L., Loiseau A., Salanon B. Surf. Sci. 481:2001;215.
10. Blanchard D.L., Thomas D.F., Xu H., Engel T. Surf. Sci. 222:1989;477.
11. Conrad E.H. Prog. Surf. Sci. 39:1992;65.
12. Lapujoulade J., Salanon B. Taub H., Torzo G., Lauter H.J., Fain S.C. et al. (Eds.), Phase Transitions in Surface Films 2. 1991;217 Plenum Press.
13. Fabre F., Gorse D., Lapujoulade J., Salanon B. Europhys. Lett. 3:1987;737.
14. Fabre F., Gorse D., Salanon B., Lapujoulade J. J. Phys. 48:1987;1017.
15. Ernst H.J., Foltkers R., Schwenger L. Phys. Rev. B. 52:1995;8461.
16. Goapper S., Barbier L., Salanon B., Loiseau A., Tolleres X. Phys. Rev. B. 57:1998;12497.
17. Giesen-Seibert M., Jentjens R., Poensgen M., Ibach H. Phys. Rev. Lett. 71:1993;3521.
18. Giesen-Seibert M., Ibach H. Surf. Sci. 316:1994;205.
19. Masson L., Barbier L., Cousty J., Salanon B. Surf. Sci. Lett. 317:1994;L1115 Surf. Sci. 324:1995;L378.
20. Masson L., Barbier L., Cousty J., Salanon B. Surf. Sci. Lett. 317:1994;L1115 Surf. Sci. 324:1995;L378.
21. Giesen M., Icking-Konert G.S. Surf. Sci. 412:1998;645.
22. E. Le Goff, Ph.D. Thesis Univ. Paris VI, 1999.
23. Barbier L., Masson L., Cousty J., Salanon B. Surf. Sci. 345:1996;197.
24. Robinson I.K., Conrad E.H., Reed D.S. J. Phys. Fr. 51:1990;103.
25. Salanon B., Lapujoulade J. Comput. Phys. Commun. 80:1994;32.
26. Barbier L., Goapper S., Salanon B., Caudron R., Loiseau A., Alvarez J., Ferrer S., Torrelles X. Phys. Rev. Lett. 78:1997;3003.
27. Dey S., Kirukhin S., West et J., Conrad E.H. Phys. Rev. Lett. 77:1996;530.
28. Rousset S. et al., Surf. Sci. 422:1999;33.