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Physical Review Letters

Volumn 82, Issue 8, 1999, Pages 1728-1731

Real-space measurement of surface roughening

(5) Hoogeman, M S a,c Klik, M A J a Schlosser D C a,d Kuipers, L a,e Frenken, J W M a,b

a FOM INSTITUTE AMOLF (Netherlands)

b LEIDEN UNIVERSITY (Netherlands)

c ANTONI VAN LEEUWENHOEK HOSPITAL (Netherlands)

d P and G European Service GmbH (Germany)

e UNIVERSITY OF TWENTE (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18344416421 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.82.1728 Document Type: Article

Times cited : (27)

References (17)

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