Reticulated vitreous carbon field emission cathodes for light source applications

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 21, Issue 1 SPEC., 2003, Pages 571-575

  Chakhovskoi, Andrei G ^a   Hunt, Charles E ^a   Forsberg, Gunnar ^b   Nilsson, Thomas ^b   Persson, Per ^b  

^a University of California   (United States)

^b LightLab AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODE RAY TUBES; COMPRESSIVE STRENGTH; ELECTRON BEAMS; ELECTRON EMISSION; LIGHT SOURCES; PHOSPHORS; POROSITY; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SURFACES; TENSILE STRENGTH; VACUUM;

BEAM FOCUSING; HIGH-TEMPERATURE THERMAL INSULATOR; RETICULATED VITREOUS CARBON FILED EMISSION CATHODES; VACUUM DEVICE APPLICATIONS;

FIELD EMISSION CATHODES;

EID: 0037207775     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1527956     Document Type: Article

References (9)

1. annual Proceedings of the International Vacuum Microelectronics Conference, 1989-2001.
2. J. Wang, Electrochim. Acta 26, 1721 (1981).
3. Technical Prospectus, Energy Research and Generation, Inc., Oakland, CA.
4. A. G. Chakhovskoi and C. E. Hunt, in 12th International Vacuum Microelectronics Conference Technical Digest, Darmstadt, Germany, 1999 (GMM-VDE/VDI, Frankfurt, Germany, 1999), pp. 338-339.
5. E. P. Sheshin, Ultramicroscopy 79, 101 (1999).
6. A. G. Chakhovskoi, C. E. Hunt, and D. E. Booth, in Abstracts of 2000 MRS Spring Meeting, San Francisco (unpublished), Paper R.5.8.
7. A. G. Chakhovskoi, C. E. Hunt, G. Forsberger, T. Nilsson, and P. Persson, in Proceedings of the 14th International Vacuum Microelectronics Conference, Davis, CA, 2001 (IEEE, Piscataway, NJ, 2001), pp. 263-264.
8. C. F. Cheng, Y. C. Tsui, and T. W. Clyne, Acta Mater. 46, 4273 (1998).
9. T. H. Her, R. J. Finlay, C. Wu, and E. Mazur, Appl. Phys. A: Mater. Sci. Process. 70, 383 (2000).