Local structure of Ge nanocrystals embedded in SiO2 studied by X-ray absorption fine structure

Journal of Synchrotron Radiation

Volumn 8, Issue 2, 2001, Pages 511-513

  Kolobov, A V ^a,b   Oyanagi, H ^b   Maeda, Y ^d   Tanaka, K ^c  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

^c JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE;

EID: 0035288880     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049500019683     Document Type: Article

References (4)

1. Maeda, Y. (1995) Phys. Rev. B, 51, 1658-1670.
2. Oyanagi H, Haga K, and Kuwahara Y, 1996 Rev. Sci. Instrum. 67 350
3. Okada, S. and Kanemitsu, Y. (1996) Phys. Rev B 54, 16421-16424.
4. Takagahara, T. and Takeda, K. (1992) Phys. Rev. B. 46, 15578.