Raman scattering studies on B+ implanted Cd0.96Zn0.04Te thin films

Vacuum

Volumn 68, Issue 2, 2002, Pages 119-122

  Sridharan, M ^a   Narayandass, Sa K ^a   Mangalaraj, D ^a   Lee, Hee Chul ^b  

^a BHARATHIAR UNIVERSITY   (India)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

B+ implantation; Cd0.96Zn0.04Te films; Raman scattering; Vacuum evaporation

Indexed keywords

EVAPORATION; ION IMPLANTATION; PHONONS; POSITIVE IONS; RAMAN SCATTERING; SEMICONDUCTING BORON; SEMICONDUCTING CADMIUM COMPOUNDS; SURFACE ROUGHNESS; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

RESONANCE RAMAN SCATTERING (RRS) EFFECTS;

THIN FILMS;

EID: 0037206627     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(02)00295-6     Document Type: Article

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