Extracting inter-diffusion parameters of TiC from AES depth profiles

Applied Surface Science

Volumn 205, Issue 1-4, 2002, Pages 231-239

  Swart, H C ^a   Jonker, A J ^a   Claassens, C H ^a   Chen, R ^a   Venter, L A ^a   Ramoshebe, P ^a   Wurth, E ^a   Terblans, J J ^a   Roos, W D ^a  

^a UNIVERSITY OF THE FREE STATE   (South Africa)

Author keywords

Activation energy; AES; Diffusion; PRLLS; TiC

Indexed keywords

ACTIVATION ENERGY; ANNEALING; AUGER ELECTRON SPECTROSCOPY; CORROSION PROTECTION; DIFFUSION; ELECTRON BEAMS; POSITIVE IONS; WEAR RESISTANCE;

POSITIVE RESTRICTED LINEAR LEAST SQUARES (PRLLS) METHOD;

TITANIUM CARBIDE;

EID: 0037204403     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01070-X     Document Type: Article

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