Auger electron spectroscopy study of MgB 2 surface

Applied Surface Science

Volumn 205, Issue 1-4, 2002, Pages 225-230

  Xu, Mingxiang ^a   Takano, Y ^a   Hatano, T ^a   Kimura, T ^a   Fujita, D ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Auger electron spectroscopy; Depth profiling; MgB 2 surface; Sputtering

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; GRAIN BOUNDARIES; SCANNING TUNNELING MICROSCOPY; SINTERING; SPUTTERING;

DEPTH PROFILING;

MAGNESIUM COMPOUNDS;

EID: 0037204371     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)01095-4     Document Type: Article

References (14)

1. Nagamatsu J., Nakagawa N., Muranaka T., Zenitani Y., Akimitsu J. Nature. 410:2001;63.
2. Takano Y., Takeya H., Fujii H., Kumakura H., Hatano T., Togano K. Appl. Phys. Lett. 78:2001;2914.
3. Xu M., Kitazawa H., Takano Y., Ye J., Nishida K., Abe H., Matsushita A., Tsujii N., Kido G. Appl. Phys. Lett. 79:2001;2779.
4. Lee S., Mori H., Masui T., Eltsev Yu., Yamamoto A., Tajima S. J. Phys. Soc. Jpn. 70:2001;2255.
5. Jin S., Mavoori H., Bower C., van Dover R.B. Nature. 411:2001;563.
6. Kang W.N., Kim H.-J., Choi E.-M., Jung C.U., Lee S.-I. Science. 292:2001;1521.
7. Kotegawa H., Ishida K., Kitaoka Y., Muranaka T., Akimitsu J. Phys. Rev. Lett. 87:2001;127001.
8. Takahashi T., Sato T., Souma S., Muranaka T., Akimitsu J. Phys. Rev. Lett. 86:2001;4915.
9. Tsuda S., Yokoya T., Kiss T., Takano Y., Togano K., Kito H., Ihara H., Shin S. Phys. Rev. Lett. 87:2001;177006.
10. Karapetrov G., Iavarone M., Kwok W.K., Crabtree G.W., Hinks D.G. Phys. Rev. Lett. 86:2001;4374.
11. Rubio-Bollinger G., Suderow H., Vieira S. Phys. Rev. Lett. 86:2001;5582.
12. Seneor P., Chen C.-T., Yeh N.-C., Vasquez R.P., Bell L.D., Jung C.U., Park M.-S., Kim H.-J., Kang W.N., Lee S.-I. Phys. Rev. B. 65:2001;012505.
13. D. Briggs, M.P. Seah, Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy, Wiley, New York, 1983.
14. Miletto Granozio F., Scotti di Uccio U., Valentino M., Condorelli G.G., Fragala I.L., Malandrino G. Physica C. 271:1996;83.