Morphology and surface properties of YBCO and TBCCO thin films: Influence of etching processes

Physica C: Superconductivity and its Applications

Volumn 271, Issue 1-2, 1996, Pages 83-93

  Granozio, F Miletto ^a   Di Uccio, U Scotti ^a   Valentino, M ^b   Condorelli, G G ^c   Fragala I L ^c   Malandrino, G ^c  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b CNR   (Italy)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ETCHING; HIGH TEMPERATURE SUPERCONDUCTORS; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY; SURFACES; THIN FILMS; X RAY SPECTROSCOPY;

SURFACE CONTAMINATION; TBCCO; YBCO;

OXIDE SUPERCONDUCTORS;

EID: 0030283302     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(96)00545-X     Document Type: Article

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