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Volumn 101, Issue 3, 2002, Pages 275-282

Model performance improvement for a calibration-free temperature measurement based on p-n junctions

Author keywords

Diode temperature sensors; Modeling; P n junction; Silicon transistor thermometers; Temperature measurement

Indexed keywords

INVERSE PROBLEMS; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; SEMICONDUCTOR JUNCTIONS; TEMPERATURE MEASUREMENT; THERMOMETERS;

EID: 0037202399     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(02)00207-8     Document Type: Article
Times cited : (6)

References (9)
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    • Quinn, T.J.1
  • 2
    • 0013284347 scopus 로고
    • SI base units definition development realisation
    • Physkalisch Technische, Bundesanstalt Braunschweig/Berlin (PTB)
    • W. Blanke, SI Base Units Definition Development Realisation, Physkalisch Technische, Bundesanstalt Braunschweig/Berlin (PTB), 1991.
    • (1991)
    • Blanke, W.1
  • 3
    • 85013038675 scopus 로고
    • P-n-junction as an ultra linear calculable thermometer
    • T.C. Verster, p-n-junction as an ultra linear calculable thermometer, Electr. Lett. 4 (1968) 175-176.
    • (1968) Electr. Lett. , vol.4 , pp. 175-176
    • Verster, T.C.1
  • 4
    • 0013281123 scopus 로고    scopus 로고
    • Genauigkeitserhöhung für Transistor-Temperatursensoren
    • Nürnberg, Germany, 13-15 May
    • B. Goloub, O. Goloub, A. Baran, Genauigkeitserhöhung für Transistor-Temperatursensoren, in: Proceedings of the Sensor'97, Vol. III, Nürnberg, Germany, 13-15 May 1997, pp. 183-188.
    • (1997) Proceedings of the Sensor'97 , vol.3 , pp. 183-188
    • Goloub, B.1    Goloub, O.2    Baran, A.3
  • 5
    • 0031645167 scopus 로고    scopus 로고
    • Measuring temperature calibration free with bipolar transistor
    • Monterey, CA, USA, 31 May-3 June
    • O. Kanoun, Measuring Temperature Calibration Free with Bipolar Transistor, in: Proceedings of the IEEE ISCAS'98, Vol. VI, Monterey, CA, USA, 31 May-3 June 1998, pp. 617-620.
    • (1998) Proceedings of the IEEE ISCAS'98 , vol.6 , pp. 617-620
    • Kanoun, O.1
  • 6
    • 0032096929 scopus 로고    scopus 로고
    • Inverse problems and parameter estimation: Integration of measurements and analysis
    • J.V. Beck, K.A. Woodbury, Inverse problems and parameter estimation: integration of measurements and analysis, Meas. Sci. Technol. 9 (1998) 839-847.
    • (1998) Meas. Sci. Technol. , vol.9 , pp. 839-847
    • Beck, J.V.1    Woodbury, K.A.2
  • 7
    • 0034246865 scopus 로고    scopus 로고
    • Modeling the p-n junction I-U characteristic for an accurate calibration-free temperature measurement
    • O. Kanoun, Modeling the p-n Junction I-U Characteristic for an Accurate Calibration-Free Temperature Measurement, IEEE Trans. Instrum. Meas. 49 (2000) 901-905.
    • (2000) IEEE Trans. Instrum. Meas. , vol.49 , pp. 901-905
    • Kanoun, O.1
  • 8
    • 0013178517 scopus 로고    scopus 로고
    • Untersuchungen zur Genauigkeitssteigerung der Kalibrationsfreien Temperaturmessung mit Halbleiter-pn-Übergängen
    • VDI-Verlag, Düsseldorf
    • R. Homer, Untersuchungen zur Genauigkeitssteigerung der Kalibrationsfreien Temperaturmessung mit Halbleiter-pn-Übergängen, VDI-Verlag, Düsseldorf, 1996.
    • (1996)
    • Homer, R.1
  • 9
    • 0013284044 scopus 로고    scopus 로고
    • Neuartige Modelle zur Kalibrationsfreien Temperatur-messung mit pn-Übergängen
    • VDI-Verlag, Düsseldorf
    • O. Kanoun, Neuartige Modelle zur Kalibrationsfreien Temperaturmessung mit pn-Übergängen, VDI-Verlag, Düsseldorf, 2001.
    • (2001)
    • Kanoun, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.