Surface morphological, microstructural, and electrochromic properties of short-range ordered and crystalline nickel oxide thin films

Applied Surface Science

Volumn 199, Issue 1-4, 2002, Pages 259-269

  Ahn, Kwang Soon ^a   Nah, Yoon Chae ^a   Sung, Yung Eun ^a  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

Electrochromic properties; Nickel oxide; Sputtering

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; CRYSTALLINE MATERIALS; CURRENT DENSITY; ELECTROCHEMISTRY; ELECTROCHROMISM; MORPHOLOGY; NICKEL COMPOUNDS; PROTONS; SPUTTERING; SURFACES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

REACTIVE RADIOFREQUENCY SPUTTERING;

SURFACE PROPERTIES;

EID: 0037202066     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00863-2     Document Type: Article

References (26)

1. Xuping Z., Guoping C. Thin Solid Films 298 1997 53.
2. C.G. Granqvist, Handbook of Inorganic Electrochromic Materials, Elsevier, Amsterdam, 1995.
3. Estrada W., Andersson A.M., Granqvist C.G. J. Appl. Phys. 64 1988 3678.
4. Green M., Kang K. Solid State Ionics 3/4 1981 141.
5. Bauke F.G.K., Bange K., Gambke T. Displays 10 1988 179.
6. Gambke T., Metz B. Glastech. Ber. 62 1989 38.
7. Lampert C.M. Solar Energy Mater. 11 1984 1.
8. Faria I.C., Kleinke M., Gorenstein A., Fantini M.C.A., Tabacniks M.H. J. Electrochem. Soc. 145 1998 235.
9. Orel I.C., Hutchins M.G., Meeking G.Mc. Solar Energy Mater. 30 1993 327.
10. Carpenter M.K., Connell R.S., Corrigan D.A. Solar Energy Mater. 16 1987 333.
11. Corrigan D.A. Solar Energy Mater. 25 1992 293.
12. Jeong D.J., Kim W.S., Sung Y.-E. Jpn. J. Appl. Phys. 40 2001 L708.
13. Jeong D.J., Kim W.S., Choi Y.K., Sung Y.-E. J. Electroanal. Chem. 511 2001 79.
14. Nemetz A., Temmink A., Bange K., Cordoba-Torresi S.C., Gabielli C., Torresi R., Hugto-Le-Goff A. Solar Energy Mater. 25 1992 93.
15. Conell R.S., Corrigan D.A., Powell B.R. Solar Energy Mater. 25 1992 301.
16. Gorenstein A., Decker F., Estrada W., Esteves C., Andersson A., Passerini S., Pantaloni S., Scrosati B. J. Electroanal. Chem. 277 1990 277.
17. Jiang S.R., Feng B.X., Yan P.X., Cai X.M., Lu S.Y. Appl. Surf. Sci. 174 2001 125.
18. Sinha K., Sirota E.B., Garoff S., Stanley H.B. Phys. Rev. B 38 1988 2297.
19. Noh D.Y., Hwu Y., Kim H.K., Hong M. Phys. Rev. B 51 1995 4441.
20. Ahn K.S., Sung Y.-E. J. Vac. Sci. Technol. A 19 2001 2840.
21. Motupally S., Steinz C.C., Weidner J.W. J. Electrochem. Soc. 145 1998 29.
22. J. McBreen, in: R.E. White, J.O'M. Bockris, B.E. Conway (Eds.), Modern Aspects of Electrochemistry, Vol. 21, Plenum Press, New York, 1990 (Chapter 2), p. 29.
23. Hahn F., Beden B., Croissant M.-J., Lamy C. Electrochim. Acta 31 1986 335.
24. Hahn F., Floner D., Beden B., Lamy C. Electrochim. Acta 32 1987 1631.
25. Y. Wu, G. Wu, X. Ni, X. Wu, in: Proceedings of the Fourth International Conference on Thin Films Physics and Applications, Proc. SPIE 4086 (2000) 418.
26. Ahn K.S., Nah Y.C., Yum J.H., Sung Y.-E. Jpn. J. Appl. Phys. 41 2002 L212.