Optical properties and structure of Ge 20 Sb x Se 80-x films

Applied Surface Science

Volumn 199, Issue 1-4, 2002, Pages 147-159

  Abu Sehly, A A ^a   Soltan, A S ^a  

^a Assiut University   (Egypt)

Author keywords

Chalcogenides; Electron microscope; Microstructure; Optical properties; Thin films

Indexed keywords

ANNEALING; CARRIER CONCENTRATION; CHEMICAL BONDS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; ENERGY GAP; GERMANIUM ALLOYS; LIGHT ABSORPTION; MICROSTRUCTURE; OPTICAL GLASS; OPTICAL PROPERTIES; PERMITTIVITY; THIN FILMS;

CHALCOGENIDES;

SURFACE PROPERTIES;

EID: 0037202057     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00604-9     Document Type: Article

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