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Volumn 128, Issue 2, 2002, Pages 205-210
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Interface formation between thin Cu-phthalocyanine films and crystalline and oxidized silicon surfaces
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Author keywords
Cu phthalocyanine; Electron spectroscopy; Interface charge transfer; n Si; Silicon oxide
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Indexed keywords
CHARGE TRANSFER;
COPPER COMPOUNDS;
CRYSTALLINE MATERIALS;
DEPOSITION;
ELECTRON ENERGY LEVELS;
ELECTRON SPECTROSCOPY;
INTERFACES (MATERIALS);
SEMICONDUCTING SILICON;
SURFACE REACTIONS;
THERMAL EFFECTS;
THIN FILMS;
ULTRAHIGH VACUUM;
LOW ENERGY ELECTRONS;
METALLIC FILMS;
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EID: 0037197622
PISSN: 03796779
EISSN: None
Source Type: Journal
DOI: 10.1016/S0379-6779(02)00017-6 Document Type: Article |
Times cited : (35)
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References (24)
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