Microwave photoconductivity techniques for the characterization of semiconductors

Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 91, Issue 92, 2002, Pages 224-228

  Citarella, G ^a   von Aichberger, S ^a   Kunst, M ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Charge carrier kinetics; Contactless photoconductance decay; Lifeime measurements; Microwave photoconductivity measurements

Indexed keywords

CHARGE CARRIERS; DATA ACQUISITION; ELECTRIC SPACE CHARGE; FREQUENCY MODULATION; INTERFACES (MATERIALS); PASSIVATION; PHASE SHIFT; PHOTOCONDUCTIVITY; RATE CONSTANTS; SILICON NITRIDE;

MICROWAVE PHOTOCONDUCTIVITIES;

SILICON WAFERS;

EID: 0037197411     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(01)01014-5     Document Type: Article

References (15)