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Volumn 75, Issue 1, 2002, Pages 79-89

Differences in development of common bean (Phaseolus vulgaris L.) crops and pod fractions within a crop II. Seed viability and vigour

Author keywords

Common bean; Electrical conductivity test; Harvest maturity; Moisture content; Physiological maturity; Pod earliness; Tetrazolium test

Indexed keywords

ELECTRIC CONDUCTIVITY; MOISTURE; SEED;

EID: 0037187663     PISSN: 03784290     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-4290(02)00014-X     Document Type: Article
Times cited : (9)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.