An AFM determination of the effects on surface roughness caused by cleaning of fused silica and glass substrates in the process of optical biosensor preparation

Biosensors and Bioelectronics

Volumn 17, Issue 6-7, 2002, Pages 547-555

  Henke, Lisa ^a   Nagy, Noemi ^a   Krull, Ulrich J ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

AFM; Fused silica; Optical biosensor; Surface roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTAMINATION; FILMS; FUSED SILICA; MOLECULES; OPTICAL SENSORS; SUBSTRATES; SURFACE CLEANING; SURFACE ROUGHNESS;

ORGANIC FILMS;

BIOSENSORS;

GLASS; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; EVALUATION; GEOMETRY; OPTICAL BIOSENSOR; SAMPLING; SURFACE PROPERTY;

BIOSENSING TECHNIQUES; GLASS; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MODELS, THEORETICAL; OPTICS; PEROXIDES; QUALITY CONTROL; SENSITIVITY AND SPECIFICITY; SILICON DIOXIDE; SURFACE PROPERTIES;

EID: 0037178186     PISSN: 09565663     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0956-5663(02)00012-X     Document Type: Article

References (12)

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8. Influences of non-selective interactions of nucleic acids on response rates of nucleic acid fiber optic biosensors