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Volumn 384, Issue 1-2, 2002, Pages 245-251
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AFM studies of PBX systems
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Author keywords
Atomic force microscopy (AFM); PBX system; Polyeurathane
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Indexed keywords
EXPLOSIVE;
POLYURETHAN;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMICAL COMPOSITION;
CHEMICAL STRUCTURE;
CRYSTAL;
GEL;
IMAGE ANALYSIS;
RIGIDITY;
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EID: 0037170169
PISSN: 00406031
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6031(01)00799-7 Document Type: Article |
Times cited : (14)
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References (10)
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