Experimental measurement of the persistence exponent of the planar Ising model

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 56, Issue 1 SUPPL. A, 1997, Pages

  Yurke, B ^a   Pargellis, A N ^a   Majumdar, S N ^b,d   Sire, C ^c  

^a LUCENT TECHNOLOGIES   (United States)

^b Yale University   (United States)

^c European Theoretical Spectroscopy Facility   (France)

^d TATA INSTITUTE OF FUNDAMENTAL RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003033253     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/physreve.56.r40     Document Type: Article

References (38)

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38. Forty points were used in all except one run, where an imperfection in one corner pinned the domain wall. In this case, the 12 points were eliminated that were in the immediate vicinity of the site.