A study on the simulated diffusion-limited current transient of a self-affine fractal electrode based upon the scaling property

Journal of Electroanalytical Chemistry

Volumn 531, Issue 2, 2002, Pages 101-109

  Shin, Heon Cheol ^a   Pyun, Su Il ^a   Go, Joo Young ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Chronoamperometry; Current transient; Fractal; Scaling property; Self affinity; Self similarity

Indexed keywords

COMPUTER SIMULATION; DIFFUSION; ELECTRIC CURRENTS; ELECTROCHEMICAL ELECTRODES; FRACTALS; TRANSIENTS;

SCALING PROPERTIES;

ELECTROCHEMISTRY;

EID: 0037162680     PISSN: 00220728     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(02)01068-9     Document Type: Article

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